Fabtex™ Yield Optimizer

Fabtex™ Yield Optimizer


行业挑战

Modern semiconductor technologies are increasingly complex, with 3D structures and tight process integration requirements. Traditional yield improvement methods—focused on isolated issues and wafer-based testing—are slow, costly, and often counterproductive.

Fabtex™ Yield Optimizer addresses these challenges by:

  • Modeling systemic process variations across the full flow
  • Simulating the impact of process changes on overall yield
  • Providing actionable insights through multi-fidelity, model-informed digital twins

Unlike standalone machine learning approaches, Fabtex delivers causality, backtracking, and root-cause analysis by integrating physics-based simulations with AI.

主要客户利益

  • Reduce Systemic Failures
    Automated workflows to detect and prevent yield excursions during ramp and HVM.
  • Accelerate Time to Market
    Identify yield issues early in ramp-up and optimize production throughput.
  • Lower Manufacturing Costs
    Improve equipment utilization and reduce losses in wafers, masks, chemicals, and labor.

產品

  • Fabtex™ Yield Optimizer

主要应用

  • Defect Analysis
    - Root-cause identification
    - Process backtracking
    - Causal modeling of failure modes
  • Yield Improvement
    - Simultaneous optimization of multiple yield detractors
    - Process retargeting and scenario analysisg
    - Quantification of expected yield gains under proposed conditions