- Modeling systemic process variations across the full flow
- Simulating the impact of process changes on overall yield
- Providing actionable insights through multi-fidelity, model-informed digital twins
-
Reduce Systemic Failures
Automated workflows to detect and prevent yield excursions during ramp and HVM. -
Accelerate Time to Market
Identify yield issues early in ramp-up and optimize production throughput. -
Lower Manufacturing Costs
Improve equipment utilization and reduce losses in wafers, masks, chemicals, and labor. - Fabtex™ Yield Optimizer
-
Defect Analysis
- Root-cause identification
- Process backtracking
- Causal modeling of failure modes -
Yield Improvement
- Simultaneous optimization of multiple yield detractors
- Process retargeting and scenario analysisg
- Quantification of expected yield gains under proposed conditions
Fabtex™ Yield Optimizer
Products
Fabtex™ Yield Optimizer is a cutting-edge software platform designed to help semiconductor foundries accelerate yield ramp and improve high-volume manufacturing performance. By leveraging virtual silicon twins—created in SEMulator3D® and validated against real fab data — Fabtex combines physics-based modeling with machine learning to diagnose and resolve process-limited yield issues.
Engineers can simulate entire process flows, apply virtual process variations, and perform Pareto analysis using virtual metrology to pinpoint high-impact process parameters. This can enable faster identification of failure modes, improved yield, and reduced time to market.
Why Fabtex™?
Fabtex™ Yield Optimizer is the only platform that combines validated virtual twins, physics-based process modeling, and machine learning to deliver comprehensive yield insights. Whether you’re ramping a new technology or optimizing mature nodes, Fabtex empowers engineers to make smarter, faster decisions.
行业挑战
Modern semiconductor technologies are increasingly complex, with 3D structures and tight process integration requirements. Traditional yield improvement methods—focused on isolated issues and wafer-based testing—are slow, costly, and often counterproductive.
Fabtex™ Yield Optimizer addresses these challenges by:
Unlike standalone machine learning approaches, Fabtex delivers causality, backtracking, and root-cause analysis by integrating physics-based simulations with AI.