Versys Metal Product Family - Lam Research

Versys Metal Product Family

Industry Challenges

For back-end-of-line (BEOL) metal etch, semiconductor manufacturers are focused on the challenges of achieving repeatable profile and critical dimension (CD) control as well as maintaining high-volume, low-cost production. While metal hardmasks facilitate BEOL integration by increasing selectivity to low-k dielectric films, they also introduce new challenges, such as the need to control trench dimension and bottom line roughness. Etch technologies that provide process tunability without compromising productivity are needed to meet the needs of hardmask and other BEOL metal etch applications. Delivering this performance with low defectivity during the etch process enables the highest device yields.

Key Customer Benefits

  • Superior CD, profile uniformity, and uniformity control enabled by a symmetrical chamber design with independent process tuning features
  • High availability, high yield, and exceptional process repeatability with proprietary chamber cleaning technology
  • Upgradable products for low cost of ownership over several device generations

Product Offerings

  • Versys® Metal
  • Versys® Metal45™
  • Versys® Metal L
  • Versys® Metal M
  • Versys® Metal N

Key Applications

  • TiN metal hardmask
  • High-density aluminum line
  • Aluminum pad