SPEED Product Family

Industry Challenges

At advanced technology nodes, chipmakers continue to require high-quality dielectric films for gapfill processes to minimize integration complexity. Deposition processes that fill these advanced structures are challenged to achieve defect-free results while maintaining high throughput. For high aspect ratio (HAR) structures at advanced nodes, alternate gapfill technologies often do not deliver the film properties needed, resulting in poor process control and increased integration complexities. Preferred approaches are to use HDP-CVD either as a complete gapfill solution or as a cap over other gapfill technologies to enhance process control and mitigate integration risks.

Key Customer Benefits

  • Best-of-breed across-wafer thickness and gapfill uniformity enabled by the ability to customize deposition and in-situ etching profile
  • Excellent particle performance and superior throughput – design allows large batch sizes between cleans and faster cleans
  • Broad process flexibility available on the same platform without requiring major hardware changes

Product Offerings

  • SPEED® NExT
  • SPEED® Max

Key Applications

  • Shallow trench isolation (STI)
  • Pre-metal dielectrics (PMD)
  • Inter-layer dielectrics (ILD)
  • Inter-metal dielectrics (IMD)
  • Passivation layers